Defect Detection via THz Imaging: Potentials and Limitations. A Brief History of THz Imaging

Defect Detection via THz Imaging: Potentials and Limitations. A Brief History of THz Imaging

Kaveh Houshmand

     

бумажная книга



Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-3-6391-0369-4
Объём: 88 страниц
Масса: 153 г
Размеры(В x Ш x Т), см: 23 x 16 x 1

Until recent years, terahertz waves were an undiscovered, or most importantly, an unexploited area of electromagnetic spectrum. Recent advances in hardware have started to open up the ?eld to new applications such as THz imaging. This non destructive technology can penetrate through diverse material such that the internal structure which is invisible to other imaging modalities, can be visualized. However, automated processing of THz images can be quite challenging. Low contrast and the presence of a widely unknown type of noise make the analysis of these images difficult. Therefore, pre-processing techniques are required for further investigations.

Данное издание не является оригинальным. Книга печатается по технологии принт-он-деманд после получения заказа.

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