Scanning Hall Probe Microscope

Scanning Hall Probe Microscope

Lambert M. Surhone, Mariam T. Tennoe, Susan F. Henssonow

     

бумажная книга



Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-6-1330-7456-9
Объём: 140 страниц
Масса: 233 г
Размеры(В x Ш x Т), см: 23 x 16 x 1

High Quality Content by WIKIPEDIA articles! Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows to map the magnetic induction associated with a sample. Current state of the art SHPM systems utilize 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).

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