Издательство: | Книга по требованию |
Дата выхода: | июль 2011 |
ISBN: | 978-6-1330-7642-6 |
Объём: | 156 страниц |
Масса: | 258 г |
Размеры(В x Ш x Т), см: | 23 x 16 x 1 |
High Quality Content by WIKIPEDIA articles! A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). As with any transmission illumination scheme, the electrons pass through a sufficiently thin specimen. However, STEM is distinguished from conventional transmission electron microscopes (CTEM) by focusing the electron beam into a narrow spot which is scanned over the sample in a raster. The rastering of the beam across the sample makes these microscopes suitable for analysis techniques such as mapping by energy dispersive X-ray (EDX) spectroscopy, electron energy loss spectroscopy (EELS) and annular dark-field imaging (ADF). These signals can be obtained simultaneously, allowing direct correlation of image and quantitative data.
Данное издание не является оригинальным. Книга печатается по технологии принт-он-деманд после получения заказа.