Издательство: | Книга по требованию |
Дата выхода: | июль 2011 |
ISBN: | 978-6-1303-6484-7 |
Объём: | 104 страниц |
Масса: | 178 г |
Размеры(В x Ш x Т), см: | 23 x 16 x 1 |
High Quality Content by WIKIPEDIA articles! X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal, the diffracted pattern is concentrated in delta function like Bragg peaks. Presence of crystalline surfaces results in additional structure along so-called truncation rods (linear regions in momentum space normal to the surface). Crystal Truncation Rod (CTR) measurements allow detailed determination of atomic structure at the surface, especially useful in cases of oxidation, epitaxial growth, and adsorption studies on crystalline surfaces.
Данное издание не является оригинальным. Книга печатается по технологии принт-он-деманд после получения заказа.